The TDS7000 Series' superior measurement fidelity, analysis, and uncompromised usability combine to simplify and speed the design of high-speed, complex systems. This family offers a superior solution to the challenging signal integrity issues faced by designers verifying, characterizing and debugging sophisticated electronic designs. Tektronix's exclusive DPX(R) acquisition technology enables waveform capture rates up to 400,000 wfms/s to quickly find rare glitches in seconds or minutes, instead of hours or days. Software solutions deliver domain expertise for advanced analysis and compliance testing, while the OpenChoice(R) architecture enables users to integrate their expertise through the ability to easily write custom programs or utilize popular commercial software. The intuitive graphical user interface delivers sophisticated capability to advanced users without intimidating occasional users.
Options
1K - K4000 Instrument Cart
1R - Rackmount Kit
2M - Acquisition Memory, 2 Ms/s per channel, 8 Ms/s maximum
3M - Acquisition Memory, 4 Ms/s per channel, 16 Ms/s maximum
4M - Acquisition Memory, 8 Ms/s per channel, 32 Ms/s maximum
A1 - Power Cord, Universal European 230V, 50 Hz
A2 - Power Cord, United Kingdom 230V, 50 Hz
A3 - Power Cord, Australian 230V, 50 Hz
A5 - Power Cord, Switzerland 230V, 50 Hz
A99 - Deletes Power Cord
AC - Power Cord, China 230V, 50 Hz
CP2 - TDSCPM2 Compliance Testing for ITU-T G.703 and ANSI T1.102 communications stds, requires opt. SM
J1 - TDSJIT2 Jitter Analysis Application software
J2 - TDSDDM2 Disk Drive Measurements Application software
JT3 - TDSJIT3 Advanced Jitter Analysis Application software with random and deterministic jitter analysis
SM - Serial Communications Mask Testing, standard on CSA7000-series
ST - Serial Pattern Triggering, standard on CSA7000-series
TC1 - Add one TCA-1 Meg TekConnect High-Impedance Buffer Amplifier
USB - USB2 Compliance Testing software for USB1.0 & 2.0 standards, requires TDSUSBF USB test fixture.
