This product is discontinued and has been replaced with the Megger
MIT510/2
Megger MIT510 5 kV Insulation Tester
Features:
AC or Battery Powered
Digital/Analogue backlit display
Selectable test voltage from 250 to 5000 V
Automatic IR test
Measures to 15 T
Complete with calibration certificate
This new Megger MIT510 5 kV insulation resistance tester from Megger is designed specifically to assist you with the testing and maintenance of high voltage electrical equipment. The case is incredibly rugged and easy to carry, being made of tough polypropylene and achieving an ingress protection rating of IP54. In addition, the model number is marked on both the top and side of the case for ease of identification in stores or vehicles.
The instrument has a large easy to read backlit LCD display making it equally suitable for use in both bright sunlight and poorly lit environments. Information displayed includes resistance, voltage, leakage current, capacitance, battery status and time constant. In addition, the elapsed time of the test is displayed constantly removing the need for separate timers.
The controls of the instrument are clear and unambiguous and a "quick start" guide is included in the lid of the instrument removing the need to carry bulky manuals under site conditions. The instrument is fitted with a guard terminal to enhance accuracy. The guard test lead is included as standard with the instrument.
To further enhance the flexibility of the instrument the MIT510 has the facility to set the test voltage in steps from 250 V to 5000 V avoiding the expense of several insulation resistance testers to meet your application needs.
This insulation resistance tester is designed to meet the highest safety standards and meets the requirements of EN61010. In addition, the instrument measures the voltage at the terminals and if this is above 50V then the instrument will display the high voltage warning and inhibit testing. At the end of the test the instrument will automatically discharge the energy transferred to the equipment during the test phase.