Model 2520 Pulsed Laser Diode Test System w/ Remote Test Head
Key Features and Benefits:
Simplifies laser diode LIV
testing prior to packaging or active temperature control
Integrated solution for
in-process LIV production testing of laser diodes at the chip or bar level
Sweep can be programmed to
stop on optical power limit
Combines high accuracy source
and measure capabilities for pulsed and DC testing
Synchronized DSP based
measurement channels ensure highly accurate light intensity and voltage
measurements
Programmable pulse on time
from 500ns to 5ms up to 4% duty cycle
Pulse capability up to 5A, DC
capability up to 1A
14-bit measurement accuracy
on three measurement channels (VF, front photodiode, back photodiode)
Measurement algorithm
increases the pulse measurement's signal-to-noise ratio
Up to 1000-point sweep stored
in buffer memory eliminates GPIB traffic during test, increasing
throughput
Digital I/O binning and
handling operations
IEEE-488 and RS-232
interfaces
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized
system for testing laser diodes early in the manufacturing process, when proper
temperature control cannot be easily achieved. The Model 2520 provides all
sourcing and measurement capabilities needed for pulsed and continuous LIV
(light-current-voltage) testing of laser diodes in one compact, halfrack
instrument. The tight synchronization of source and measure capabilities
ensures high measurement accuracy, even when testing with pulse widths as short
as 500ns.
