The SDA is the first fully integrated test
system designed specifically for evaluating the physical layer characteristics
of both optical and electrical serial data signals. The highest fidelity
frontend in the industry coupled with LeCroy's X-Stream Technology provide the
foundation for this powerful analysis system that not only conducts Pass/Fail
measurements but also traces the fault to the actual bit causing the error.
Specifications
4 Channels
6 GHz Bandwidth
10 GS/s Single-shot Sample Rate in 4 Ch Mode, 20 GS/s in 2 Ch Mode
Standard Memory: 4Mpt/Ch in 4 Ch Mode, 8Mpt/Ch in 2 Ch Mode
Memory Expandable to 48Mpts/Ch Maximum in 2 Channel Mode (Optional)
75 ps Rise Time (typical)
All-SiGe front end (75 ps rise time)
1 ps RMS jitter noise floor
< 2.5ps RMS trigger jitter
Color 10.4" flat-panel TFT-LCD with high resolution touch screen
