Small Compact Probe Head for Probing Small Geometry Circuit Elements
DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
Robust Design for Reliability
Easy-to-Use
Connects Directly to DPO7000 and DPO4000 Series Oscilloscopes Using the New TekVPI™ Probe Interface
Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
Applications
Verification, Debug and Characterization of High-speed Designs
Signal integrity, Jitter, and Timing Analysis
Manufacturing Engineering and Test
Signals with Voltage Swings up to 8 Vp-p
Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high frequency measurements. With our ultra-low input capacitance and unique interface, the TAP2500 and TAP3500 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today’s digital system designs.
Specifically designed for use and direct connection to the TekVPI™ probe interface used on the DPO7000 and DPO4000 Series oscilloscopes, the TAP2500 and TAP3500 Active FET probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional problems:
Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance
Versatile DUT connectivity for attaching to small SMDs
Preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 3.5 GHz
