The 8510XF systems have been designed to make fully- calibrated, single-sweep
measurements of broadband devices to 110 GHz, in 1.0 mm coax. By building on the
8510 network analyzer s capabilities, the 8510XF provides the highest
measurement performance in frequency coverage, dynamic range, and measurement
accuracy.
With the low-frequency extension (Option 005), the 8510XF extends its low-end
frequency from 2 GHz down to 45 MHz, providing frequency coverage from 45 MHz up
to 110 GHz in a single sweep. Other models are available to sweep from 45 MHz to
85 GHz and from 2 GHz to 85 GHz.
By adding a wafer probing station with 1.0 mm probes, you can perform
fully-calibrated on-wafer measurements to 110 GHz.
Broad frequency coverage, from 45 MHz to 110 GHz, in a single sweep
Band switching performed internally by the 8510XF
Ability to accurately control power at test ports with power control range
of greater than 20 dB at 110 GHz
New test heads designed for convenient on-wafer and coaxial measurements
Full-frequency calibrations supported on-wafer and in coax using a new 1.0
mm coaxial calibration kit
