PEL2041 Single Channel Module (2.5~500V, 10A, 350W)
Features:
The PEL-2000 Series is designed to meet the continuing shift toward high speed operation in today's semiconductor market. As the power supply units, DC-DC converters, and batteries that drive semiconductor circuits need to follow this shift, power supply design, quality inspection and characteristic certification using high-speed performance loads have become necessary. The PEL-2000 Series includes two types of mainframes and 4 types of load modules to accommodate users' requirements in a flexible manner. Any load module combination can used with a mainframe to tailor a test system based on the number of channels, and the maximum load power, voltage and current of each channel. Multiple loads can be connected in parallel to provide a higher-power load to test higher power supply outputs. This flexibility significantly reduces the investment needed for future projects that have differed power requirements. The PEL-2004 is a 4-slot mainframe with a master control unit to hold 4 load modules, while PEL-2002 is a 2-slot mainframe with master control unit to hold 2 load modules. When the PEL-2004 is configured with 4 load modules rated at 350W each, the PEL-2000 series is able to sink up to 1.4kVA of power.
For higher load capacities, mainframes can be linked together in parallel with standard MIL 20-pin connectors. A maximum of 5 mainframes, including one master and 4 slaves can be chained together to create a total load capacity of 7kW for high current and high power applications. Using 4 dual channel load modules, the PEL-2004 is able to test 8 power supply outputs simultaneously. The Sequence function allows each channel to change its load sink according to a predefined sequence at a rate of up to 100 s per step. Each sequence is able to run concurrently, under the control of one clock. This is one of the most powerful features of the PEL-2000 Series as it is able to realistically simulate a multi-output power supply load. Under Dynamic mode, the load current or load resistance pulses
between two preset levels at a pre-defined speed up to 25 s per step. This is often used as the standard test procedure to verify the response of a power supply to quick load changes. Most remarkably, multiple load channels can be connected in parallel to run Dynamic tests synchronously under a single clock. This Parallel Dynamic functionality gives the flexibility to perform dynamic tests for a high-power
power supply without the need of another high-power load.
Specifications:
-Sequence function to do high Efficient load simulations
-Flexible configuration with mainframes and plug-in modules
-Multiple independent load inputs up to 8 channels in a mainframe
-Parallel connection of inputs for increased load capacity
-Parallel connection of inputs for static and dynamic tests
-Multiple channels run for dynamic tests under one clock control
-Maximum rated power for low range high resolution CC tests
-Von setting and Von on/off for start-up Von tests
-Program mode to create work routines for repetitive tests
-OPP/OCP/OVP/OTP protections
-External channel control/monitoring via an analog control connector
-Multi-Interface USB Device / Host, RS-232C, and GPIB (Optional PEL-001)
-Multi-mainframe link up to 5 mainframes in a system
