Parallel Digital Pattern Generator
Testing of high performance data
communications components or
systems requires a digital data pattern
generator with I/O flexibility and
superior signal quality. The BA14400B
16-bit Parallel Pattern Generator is
designed to meet these demanding
research, development, and manufacturing
test scenarios with the most
flexible output interface in its class.
Featuring variable amplitude and
offset for both single-ended and
differential outputs, the BA14400B
supports any logic family you can
name and is ideally suited for characterization
of current and future
telecom/datacom components and
systems.
Pattern generation in the parallel
domain can often provide significant
cost savings for Mux/Demux and
SERDES testing. Because the
BA14400B generates industry standard
pseudo-random patterns, it can be
used in combination with popular serial
bit error rate detectors, or with the
companion BA14400B-PD BitAlyzer
Bit Error Rate Detector and Error
Analyzer, further reducing test system
cost.
When paired with the companion
Parallel Bit Error Rate Detector, the
patented BitAlyzers provide more than
just bit error rate numbers. By studying
the bit location of errors found in a
data stream, BitAlyzers measure
independent bits and burst error
statistics, correlate errors to reveal
pattern sensitivities, display the
probability of having error bursts of
different lengths, isolate systematic
error sources, and much more.
- 制造商: SyntheSys Research
- 模型: BITALYZER 14400B-PG
