Active FET Probe, 10X, 1.5GHz
The P6248, P6247 and P6246 enable users to make time domain or frequency domain measurements on high bandwidth signals commonly found in disk drive, digital IC design (RAMBUS) and communication applications (Gigabit Ethernet, IEEE-1394 Firewire and Fibre Channel). The P6248 includes accessories that allow RAMBUS via probing and IEEE-1394 interconnect access. The small probe head geometry and assorted probe tip accessories allow these probes to easily accommodate manual probing of surface mount devices while maintaining high CMRR.
The P6246, P6247 and P6248 are ideal for design verification of disk drive read channel electronics and timing analysis for troubleshooting ground bounce problems associated with high speed logic. They can also be used for pulse shape or cross talk compliance testing of high speed communication signals.
