Semiconductor Device Analyzer. Single-box solution for current-voltage (IV), capacitance-voltage (CV), pulse generation, fast IV, and time-domain measurement.
Ten module slots for source monitor units (SMUs) and other module types (MFCMU, HV-SPGU and WGFMU)
Supports current-voltage (IV) measurement to 0.1fA and 0.5 MicroV
Supports both quasi-static and medium-frequency capacitance-voltage (CV) measurement
Supports accurate fast IV and time-domain measurement for a wide range of applications such as pulsed IV, NBTI and RTS noise (RTN) measurement.
Supports high voltage pulse generation (up to +/-40 V) for high power and memory device testing.
