Discontinued - Semiconductor Test Pulser AVR-CD1-B
The AVR-CD1-B is a high performance, GPIB and RS232-equipped instrument intended for reverse recovery time testing of diodes and other semiconductor devices.
The AVR-CD1-B will apply a 5 us wide forward bias pulse with an adjustable amplitude of +0.1A to +10A to a device under test (DUT). At the end of that pulse, the current ramps downward at an adjustable rate of < 20 to > 200 A/us until the diode stops conducting.
The maximum specified ramp duration is 1 us.
