The AVR-EB series was designed for MIL-STD-750E diode switching
time tests, including Method 4026.3 forward recovery time tests and Method
4031.4 reverse recovery time tests (Conditions A and B1-B4). Avtech can also
provide test systems for MIL-STD-750E Method 4031.4 Test Condition D, where a
ramped current with adjustable di/dt is used.
