The AVR-EB series was designed for MIL-STD-750E diode switching time tests, including Method 4026.3 forward recovery time tests and Method 4031.4 reverse recovery time tests (Conditions A and B1-B4). Avtech can also provide test systems for MIL-STD-750E Method 4031.4 Test Condition D, where a ramped current with adjustable di/dt is used. Method 4031.4 Condition B Reverse Recovery Tests Models AVR-EB4-B, AVR-EB5-B and AVR-EB7-B are provided for Condition B reverse recovery tests of MIL-STD-750E Method 4031.4. The AVR-EB4-B is intended for reverse recovery testing of high-speed power rectifiers. The similar AVR-EB5-B is intended for more specialized reverse recovery testing of long-lifetime high-voltage PIN diodes, and the AVREB7- B is intended for low-current small-signal diodes.
The AVR-EB2A-B is intended for Method 4031.4 Condition A reverse recovery tests of low current switching diodes. Model AVR-EBF6-B is intended for Method 4026.3 forward recovery tests.
