Tektronix R3765C measures the complex transmission and reflection
characteristics of two port devices in the frequency domain. It does this by sampling the incident signal, separating the transmitted and
reflected waves, and then performing ratios that are directly related to the
reflection and transmission coefficients of the two port. Frequency is swept to rapidly obtain amplitude and phase information over a
band of frequencies of interest. This unit utilize synthesized frequency sources to provide a known test
stimulus that can sweep across a range of frequencies or power levels.
