Keysight 4291B RF Impedance Analyzer, 1 MHz to 1.8 GHz
The Agilent 4291B RF impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials. The Agilent 4291B uses a direct current-voltage measurement technique, opposing the reflection measurement technique, for more accurate impedance measurement over wide impedance range.
Basic impedance accuracy is +/- 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8-m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.
The Agilent 4291B also provides automatic level control and monitor of test signals by using IBASIC programming function; devices can be measured under a constant voltage or current. Measure bias dependent impedance characteristics with optional dc bias (up to 40 V and 100 mA). At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit constant values of five circuit models.
The Agilent 4291B has two measurement channels; each channel can be set to measure a single (e.g. Z) or dual (e.g. Z-theta) impedance parameter. The color TFT with split-display can show both active traces and memory traces (stored in RAM). A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format. With built-in IBASIC, you can control external test equipment such as a temperature chamber or wafer prober directly from the Agilent 4291B. You do not need a separate instrument controller.
The Agilent 4291B enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency. The Agilent 4291B provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).
Options
- 001 - Add DC Bias
- 002 - Material Measurement
- 011 - Delete High Imp Test Head
- 012 - Add Low Imp Test Head
- 013 - High Temperature High Imp Test Head w/Fixture Stand
- 014 - High Temperature Low Imp Test Head w/Fixture Stand
- 1A2 - Keyboard Less
- 1CM - Rack Mount Kit
- 1CN - Handle Kit
- 1CP - Rack Mount and Handle Kit
- 1D5 - High Stability Frequency Reference
- OBW - Add Service Manual
