Multi-channel parallel testing is supported by the all-in-one SQA incorporating Pulse Pattern Generators (PPG) and Error Detectors (ED). One-touch key operations simplify complex searches for input thresholds and phase adjustments, making the MP1800 perfect for R&D into 100 GE systems, optical modulators, high-speed logic, ICs, digital systems, and PONs.
Features:
Wide bandwidth from 100 Mbit/s to 56 Gbit/s
High-quality, Low-jitter Waveforms
Up to 28.1 Gbit/s Jitter Tolerance Tests (SJ, RJ, BUJ, SSC)
High Input Sensitivity and Wide Phase Margin Signal Quality Analysis
Burst Measurement for PON and Loop Circuit measurements
Optical Interfaces
Multi-channel Parallel BER test for X-Talking evaluation
