General Testers : FETest ParaScope Lite+ with E1 + Vseries

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FETest ParaScope Lite+ with E1 + Vseries
放大图片FETest ParaScope Lite+ with E1 + Vseries

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FETest ParaScope Lite+ with T1 + E1 + Vseries
FETest ParaScope Lite+ with T1 + E1 + Vseries
Handheld tester with dual port and large color display, with dual port E1 and V-series interfaces. Includes carrying case, cables and rechargeable battery.

Some of the features of ParaScope Lites's features include:
  • T1: ESF, SF, unframed
  • E1: PCM30, PCM31, PCM30/CRC PCM31/CRC, G.703 2048 kbit/s,
  • Unframed E1: G.703 2048 kbit/s, G.703 64 kbit/s
  • THROUGH mode testing (transparent and overwrite)
  • Bit Error Testing
  • ITU-T G.821, G.826 and M2100 Analysis
  • Histogram Analysis
  • Error Injection
  • Jitter Analysis
  • Round Trip Delay Measurements
  • Frequency Offset testing
  • CAS, ABCD Monitoring
  • V.24/RS232, V.35, V.36/RS449, x.21, EIA 530/530A, RS485/RS422, DTE/DCE mode
  • Alarm Monitoring and Generation
  • Framing Bits and Timeslot Monitoring
  • Nx64 kbit/s, Nx56 kbit/s
  • Remote Operation
  • 制造商: FETest
  • 模型: ParaScope Lite+ with E1 + Vseries