General Testers : FETest ParaScope Lite+ with T1 + E1

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FETest ParaScope Lite+ with T1 + E1
放大图片FETest ParaScope Lite+ with T1 + E1

Call 1-800-615-8378 for more information

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租赁测试设备


Handheld tester with dual port and large color display, supports T1 and dual port E1 interfaces. Includes carrying case, cables and rechargeable battery.

Some of the features of ParaScope Lites's features include:
  • T1: ESF, SF, unframed
  • E1: PCM30, PCM31, PCM30/CRC PCM31/CRC, G.703 2048 kbit/s,
  • Unframed E1: G.703 2048 kbit/s, G.703 64 kbit/s
  • THROUGH mode testing (transparent and overwrite)
  • Bit Error Testing
  • ITU-T G.821, G.826 and M2100 Analysis
  • Histogram Analysis
  • Error Injection
  • Jitter Analysis
  • Round Trip Delay Measurements
  • Frequency Offset testing
  • CAS, ABCD Monitoring
  • V.24/RS232, V.35, V.36/RS449, x.21, EIA 530/530A, RS485/RS422, DTE/DCE mode
  • Alarm Monitoring and Generation
  • Framing Bits and Timeslot Monitoring
  • Nx64 kbit/s, Nx56 kbit/s
  • Remote Operation
  • 制造商: FETest
  • 模型: ParaScope Lite+ with T1 + E1