Fast-sweeping built-in synthesized source with optional 1
Hz frequency resolution
Integrated switching test set measures all four
S-parameters with a single connection
Vector accuracy enhancement
Optional time domain capability computes and displays
response versus time or distance
Optional solid state switch allows simultaneous
measurement of forward and reverse parameters and continuous update for
all four s-parameters as required for two-part error correction
Productivity is enhanced with pass/fail testing, direct
printer/plotter output of results, advanced marker functions, and
save/recall of test configurations.
Two independent display channels for simultaneous
measurement of reflection and transmission characteristics
