In all cases, both high and low limits are operator programmable for quick, and easy pass/fail testing. These dual limits are essential to ensure that the device under test is actually making contact with the tester. For consistent testing, up to 50 setups can be stored in instrument memory for later recall. An optional high voltage scanner is also available for testing multi-connection devices.
Features
AC Hipot Voltage 50 to 5000V, Output Current to 100mA
200mA Short Circuit Current
Programmable AC Hipot Frequency 50Hz - 600Hz
Real Current Measurement
DC Hipot Voltage 50 to 6000V, Output Current to 20mA
IR Measurements 100k? to 50G?, Test Voltage 50 to 5000VDC
Arc Current Monitor Output
Floating Output per EN50191
GFI for Safety
Programmable Ramp and Test Times
Fast Cutoff and Quick Discharge of Device Under Test
Internal Storage and Recall of 50 Test Setups, 10 Steps Each
Front and Rear Panel Output Connections
Front Panel Lockout Prevents Changes to the Test Setup
Automatic Offset to Zero Out Stray Leakage Current
