In all cases, both high and low limits are operator programmable for quick, and easy pass/fail testing. These dual limits are essential to ensure that the device under test is actually making contact with the tester. For consistent testing, up to 50 setups can be stored in instrument memory for later recall. An optional high voltage scanner is also available for testing multi-connection devices.
Features
DC Hipot Voltage 100 to 20,000V, Output Current to 5mA
IR Measurements 100k? to 50G?, Test Voltage 50 to 1000VDC
Programmable Ramp and Test Times
Fast Cutoff and Quick Discharge of Device Under Test
Programmable Hi/Lo Limits for Pass/Fail Testing
LCD Display for Menu Programming and Test Results
Internal Storage and Recall of 50 Test Setups, 10 Steps Each
Front and Rear Panel Output Connections
Front Panel Lockout Prevents Changes to the Test Setup
Automatic Offset to Zero Out Stray Leakage Current
