Phase Noise Measurement Solution, 50 kHz to 26.5 GHz
The new Agilent E5500 A-series phase noise measurement solutions
have been designed to minimize production ATE test times for oneport
VCOs, DROs, crystal oscillators, and synthesizers and to maximize
the capability for R&D benchtop applications. In addition, with
a standard offset range capability from 0.01 Hz to 100 MHz, the
E5500 B-series provides the capability, flexibility, and versatility to
meet changing and demanding needs placed upon the R&D engineer.
By building upon 30 years of Agilent low phase noise, RF design and
measurement experience, the E5500 series solutions continue to
provide excellent measurement integrity, repeatability, and accuracy.
The E5500 phase noise measurement solutions use the power
of a flexible software program to automate phase noise carrier measurements.
The E5500 A-series solutions include the 70420A phase
noise test set, which contains phase detectors and phase-lock loop
circuitry, a high speed VXI digitizer with mainframe and high speed
VXI-to-PC interface for base-band signal analysis, selected low-noise
frequency downconverters, and measurement software. When combined
with a PC running Windows NT 4.0, this series provides fast
phase noise measurements of carrier frequencies from 50 kHz to 1.6
GHz, 6.0 GHz, 18 GHz, or 26.5 GHz over offset-from-carrier frequencies
of 0.01 Hz to 4 MHz.1 The E5500 B-series includes the 70420A
phase noise test set, a Pentium PC running Windows NT 4.0, a PC digitizer,
and an RF spectrum analyzer, selected low-noise frequency
downconverters, and measurement software. This series of solutions
provides phase noise measurements of carrier frequencies from 50
kHz to 1.6 GHz, 6.0 GHz, 18 GHz, or 26.5 GHz over offset-from-carrier
frequencies from 0.01 Hz to 100 MHz. A variety of signal generators
such as the 8662A, 8663A, 8643A, 8644B, 8664A/B, 8665Acan also be
added to provide a low-noise reference signal.
Features:
50 kHz to 26.5 GHz with expanded carrier frequencies to 110 GHz
Quick and easy integration into your ATE system
Fastest phase noise measurements available
Ability to test a wide range of devices
Measure AM noise directly
Industry leading sensitivity
Flexible configurations enhance sharing equipment with other measurements
