Semiconductor Parameter Analyzer The Agilent 4155C Semiconductor Parameter Analyzer is a cost-effective, accurate laboratory bench top solution for advanced device characterization. The low-current and low-voltage resolution and built-in quasi-static CV measurement capability of the 4155C provide a firm foundation for future expansion with other measurement instruments. The 41501B Expander extends your capabilities to 1A/200V, and add a low noise ground unit and dual pulse generators on the 4155C.
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020 Delete Windows Controller for Parametric Analysis & Chracterization