The Agilent 8517B test set has an architecture that develops a separate reference channel for each incident port. RF switching is done with a built-in electronic switch. For active device measurements, the test sets include the ability to apply dc bias (external) to the test port center conductors. Also available are two 60 dB step attenuators, which allow control of the port 1 and port 2 signal levels. Option 007 high dynamic range configuration.
Specifications
45 MHz to 50 GHz
Separate reference channel for each incident port
Built-in electronic switch
OPTIONS
001 - Adds IF switching
002 - Deletes the attenuators, std power range
004 - High input power configuration
007 - Material for combination of 999,003,027; low and high test port power
027 - Test set with high source power, maximum output power of +13 dBm
047 - Material for combination of 004,003,027; low and high port power and high input power
